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Ai-Erh Chuang
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Ai-Erh Chuang
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Ai-Erh Chuang
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1
Hot-Carrier and Bias Temperature Instability Effects on 90 nm Node MOSFETs
by
Ai
-
Erh
Chuang
,
莊愛爾
Published 2008
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2
Hot-Carrier and Bias Temperature Instability Effects on 90 nm Node MOSFETs
by
Ai
-
Erh
Chuang
,
莊愛爾
Published 2008
Get full text
Others
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