Influence of Series Massive Resistance on Capacitance and Conductance Characteristics in Gate-Recessed Nanoscale SOI MOSFETs

by Avraham Karsenty, Avraham Chelly
Published 2013-01-01

Anomalous DIBL Effect in Fully Depleted SOI MOSFETs Using Nanoscale Gate-Recessed Channel Process

by Avi Karsenty, Avraham Chelly
Published 2015-01-01

Small Signals’ Study of Thermal Induced Current in Nanoscale SOI Sensor

by Yaakov Mandelbaum, Ilan Gadasi, Avraham Chelly, Zeev Zalevsky, Avi Karsenty
Published 2017-01-01

Study of the Photo- and Thermoactivation Mechanisms in Nanoscale SOI Modulator

by Yaakov Mandelbaum, Ariel Zev, Avraham Chelly, Zeev Zalevsky, Avi Karsenty
Published 2017-01-01

Modeling of Current-Voltage Characteristics of the Photoactivated Device Based on SOI Technology

by Doron Abraham, Avraham Chelly, David Elbaz, Shimron Schiff, Michah Nabozny, Zeev Zalevsky
Published 2012-01-01