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Hsieh, Ting-Huan
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Hsieh, Ting-Huan
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1
A Study of New Plasma Induced Damage Recorder and Charge Splitting Characteristic by Advanced FinFET Logic CMOS Technology
by
Hsieh
,
Ting
-
Huan
,
謝定寰
Published 2017
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2
In-Situ TEM Observation of ZnO Nanowires Growth in Liquid
by
Hsieh
,
Ting
-
Huan
,
謝庭歡
Published 2015
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