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Isella, G.
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Isella, G.
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Isella, G.
'
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1
Defect Characterization in SiGe/SOI Epitaxial Semiconductors by Positron Annihilation
by
Ferragut R
,
Calloni A
,
Dupasquier A
,
Isella
G
Published 2010-01-01
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Article
2
Photoluminescence Study of Low Thermal Budget III–V Nanostructures on Silicon by Droplet Epitaxy
by
Isella
G
,
Chrastina D
,
Fedorov A
,
Bietti S
,
Somaschini C
,
Sarti E
,
Koguchi N
,
Sanguinetti S
Published 2010-01-01
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Article
3
Erratum to: Photoluminescence Study of Low Thermal Budget III–V Nanostructures on Silicon by Droplet Epitaxy
by
Isella
G
,
Chrastina D
,
Fedorov A
,
Bietti S
,
Somaschini C
,
Sarti E
,
Koguchi N
,
Sanguinetti S
Published 2010-01-01
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Article
4
Graphene/Ge microcrystal photodetectors with enhanced infrared responsivity
by
Anzi, L.
,
Ballabio, A.
,
Barzaghi, A.
,
Biagioni, P.
,
Bottegoni, F.
,
Falcone, V.
,
Frigerio, J.
,
Isella
,
G
.
,
Sordan, R.
,
Zucchetti, C.
Published 2022
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Related Subjects
Absorption edges
Electrical and optical properties
Faceted morphology
Finite difference time domain method
Finite-difference time-domain simulation
Graphene
High refractive
Infrared light
Infrared responsivity
Light absorption
Light-trapping effects
Microcrystals
Morphology
Refractive index
Si substrates
Spectral windows
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