Fabrication and convergent X-ray nanobeam diffraction characterization of submicron-thickness SrTiO3 crystalline sheets

by J. A. Tilka, J. Park, K. C. Sampson, Z. Cai, P. G. Evans
Published 2016-12-01

Electrode-stress-induced nanoscale disorder in Si quantum electronic devices

by J. Park, Y. Ahn, J. A. Tilka, K. C. Sampson, D. E. Savage, J. R. Prance, C. B. Simmons, M. G. Lagally, S. N. Coppersmith, M. A. Eriksson, M. V. Holt, P. G. Evans
Published 2016-06-01