Showing 1 - 8 results of 8 for search 'J. Drinovsky' Skip to content
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  • J. Drinovsky
Showing 1 - 8 results of 8 for search 'J. Drinovsky', query time: 0.07s Refine Results
  1. 1
    Estimation of EMI Filter Performance for the "Worst Case" System
    Estimation of EMI Filter Performance for the "Worst Case" System
    by J. Svacina, J. Drinovsky
    Published 2006-12-01
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    Article
  2. 2
    Evolutionary Synthesis of Fractional Capacitor Using Simulated Annealing Method
    Evolutionary Synthesis of Fractional Capacitor Using Simulated Annealing Method
    by J. Slezak, T. Gotthans, J. Drinovsky
    Published 2012-12-01
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    Article
  3. 3
    Potential Worst-case System for Testing EMI Filters Tested on Simple Filter Models
    Potential Worst-case System for Testing EMI Filters Tested on Simple Filter Models
    by Z. Raida, J. Svacina, J. Drinovsky
    Published 2008-09-01
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    Article
  4. 4
    Feature Selective Validation of Automotive EMC Pre-compliance Tests
    Feature Selective Validation of Automotive EMC Pre-compliance Tests
    by V. Ruzek, J. Drinovsky, J. Cupak
    Published 2018-04-01
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    Article
  5. 5
    Estimation of the EMI Filter Circuitry from the Insertion Loss Characteristics
    Estimation of the EMI Filter Circuitry from the Insertion Loss Characteristics
    by Z. Kejik, J. Drinovsky, V. Ruzek
    Published 2010-06-01
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    Article
  6. 6
    Multi-Objective Self-Organizing Migrating Algorithm: Sensitivity on Controlling Parameters
    Multi-Objective Self-Organizing Migrating Algorithm: Sensitivity on Controlling Parameters
    by P. Kadlec, Z. Raida, J. Drinovsky
    Published 2013-04-01
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    Article
  7. 7
    Simple Models of EMI Filters for Low Frequency Range
    Simple Models of EMI Filters for Low Frequency Range
    by Z. Raida, J. Svacina, J. Drinovsky
    Published 2008-09-01
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    Article
  8. 8
    Insertion Loss Estimation of EMI Filters in Unmatched Input/Output Impedance System
    Insertion Loss Estimation of EMI Filters in Unmatched Input/Output Impedance System
    by J. Drinovsky, Z. Kejik, V. Ruzek, J. Zachar, J. Svacina
    Published 2011-04-01
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    Article
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