Molecular characterization of bacterial leaf streak resistance in hard winter wheat

by Sai Mukund Ramakrishnan, Jagdeep Singh Sidhu, Shaukat Ali, Navjot Kaur, Jixiang Wu, Sunish K. Sehgal
Published 2019-07-01

Genome-Wide Association Study for Spot Blotch Resistance in Hard Winter Wheat

by Girma T. Ayana, Shaukat Ali, Jagdeep S. Sidhu, Jose L. Gonzalez Hernandez, Brent Turnipseed, Sunish K. Sehgal
Published 2018-07-01

Fine Mapping of the Wheat Leaf Rust Resistance Gene <i>Lr42</i>

by Harsimardeep S. Gill, Chunxin Li, Jagdeep S. Sidhu, Wenxuan Liu, Duane Wilson, Guihua Bai, Bikram S. Gill, Sunish K. Sehgal
Published 2019-05-01

Assessing the genetic diversity and characterizing genomic regions conferring Tan Spot resistance in cultivated rye.

by Jagdeep Singh Sidhu, Sai Mukund Ramakrishnan, Shaukat Ali, Amy Bernardo, Guihua Bai, Sidrat Abdullah, Girma Ayana, Sunish K Sehgal
Published 2019-01-01

Mining and genomic characterization of resistance to tan spot, Stagonospora nodorum blotch (SNB), and Fusarium head blight in Watkins core collection of wheat landraces

by Jyotirmoy Halder, Jinfeng Zhang, Shaukat Ali, Jagdeep S. Sidhu, Harsimardeep S. Gill, Shyamal K. Talukder, Jonathan Kleinjan, Brent Turnipseed, Sunish K. Sehgal
Published 2019-11-01

Genome-Wide Association Study Uncovers Novel Genomic Regions Associated With Coleoptile Length in Hard Winter Wheat

by Jagdeep Singh Sidhu, Dilkaran Singh, Harsimardeep Singh Gill, Navreet Kaur Brar, Yeyan Qiu, Jyotirmoy Halder, Rami Al Tameemi, Brent Turnipseed, Sunish Kumar Sehgal
Published 2020-02-01

Genome-wide association analysis permits characterization of Stagonospora nodorum blotch (SNB) resistance in hard winter wheat

by Rami AlTameemi, Harsimardeep S. Gill, Shaukat Ali, Girma Ayana, Jyotirmoy Halder, Jagdeep S. Sidhu, Upinder S. Gill, Brent Turnipseed, Jose L. Gonzalez Hernandez, Sunish K. Sehgal
Published 2021-06-01

An Analysis of Soil Coring Strategies to Estimate Root Depth in Maize (Zea mays) and Common Bean (Phaseolus vulgaris)

by James D. Burridge, Christopher K. Black, Eric A. Nord, Eric A. Nord, Johannes A. Postma, Jagdeep S. Sidhu, Larry M. York, Larry M. York, Jonathan P. Lynch
Published 2020-01-01