Investigation of Low-Frequency Noise Characterization of 28-nm High-k pMOSFET with Embedded SiGe Source/Drain

by Shih-Chang Tsai, San-Lein Wu, Jone-Fang Chen, Bo-Chin Wang, Po Chin Huang, Kai-Shiang Tsai, Tsung-Hsien Kao, Chih-Wei Yang, Cheng-Guo Chen, Kun-Yuan Lo, Osbert Cheng, Yean-Kuen Fang
Published 2014-01-01

Lifetime Prediction Under Different Operation Mode In NMOSFET

by Zong-HanWu, 吳宗翰
Published 2018

Effects of Counter-Doping Process on the Characteristics and Reliability of High Voltage MOS Transistors

by Chao-ChingChan, 詹朝景
Published 2018

Physical Mechanism and Lifetime Prediction under Different Bias in p-Channel MOSFETs

by Shih-HsuanLin, 林世瑄
Published 2019

Investigation of Lifetime Model of High Voltage MOSFET Under Different Operation Mode

by Ming-JuSun, 孫名儒
Published 2019

Effects of Different Processes on the Characteristics and Reliability of FinFET

by Chun-TingChen, 陳俊庭
Published 2019

Effects of Different Process on the Characteristics and Reliability of MOS Transistors

by Yen-LinTsai, 蔡炎霖
Published 2019

Hot Carrier Reliability of High Voltage MOSFET for Different Lightly Doped Drain Doping Concentration

by Shang-FengShen, 沈尚鋒
Published 2017

Hot-Carrier Degradation of N-Type MOSFET under Various Bias Condition

by Shih-AnCheng, 鄭世安
Published 2017

Analysis on Hot Carrier Reliability for High Voltage MOS Device with Different Processes

by Chun-YenChen, 陳俊諺
Published 2017

Mechanism of Hot Carrier-Reliability in High Voltage P-type LDMOS Transistors

by Chin-Rung Yan, 嚴進嶸
Published 2007

The Effect of Device Dimension on Hot Carrier Reliability of n-type LDMOS Transistors

by Wei-Chieh Wang, 王瑋傑
Published 2007

Characteristics and Reliability of n-channel High-Voltage Transistors

by wei-chin Huang, 黃偉晉
Published 2007

Investigation of Negative Bias Temperature Instability and Electrostatic Discharge in CMOSFETs

by Dao-HongYang, 楊道宏
Published 2010

Characteristics and hot carrier reliability of n-type MOS transistor with difference channel width

by Jan-YowChen, 陳建佑
Published 2010

Studies on hot-carrier induced degradation in DEMOS

by Yu-DiWang, 王裕迪
Published 2010

Reliability in p-type LDMOS Transistors

by Ling-IYeh, 葉怜宜
Published 2010

Width dependence of hot carrier degradation in P-channel MOS Transistors

by Liang-YuChou, 周亮宇
Published 2010

Hot Carrier Reliability of n-channel Lateral Diffused Metal Oxide Semiconductor Field Effect Transistor (LDMOS)

by Kuang-Wan Lin, 林洸萬
Published 2004

The characteristics of n-channel lateral diffused metal-oxide-semiconductor (LDMOS) field effect transistors with different gate oxide thickness

by Chi-Chih Chen, 陳吉智
Published 2004