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Jung-Hyeon Ryu
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Jung-Hyeon Ryu
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Jung-Hyeon Ryu
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1
Test circuit for verifying dielectric performance of phase-to-enclosure during capacitive current breaking
by
Jung
-
Hyeon
Ryu
,
Jin-Hwan Kim
,
Seung-Jae Park
,
Kern-Joong Kim
Published 2016-01-01
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Article
2
Optimal planning of series resistor to control time constant of test circuit for high-voltage AC circuit-breakers
by
Yoon-Ho Kim
,
Jung
-
Hyeon
Ryu
,
Jin-Hwan Kim
,
Kern-Joong Kim
Published 2016-01-01
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Article
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