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KyoungHwan Hwang
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KyoungHwan Hwang
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Reliable strain measurement in transistor arrays by robust scanning transmission electron microscopy
by
Suhyun Kim
,
Joong Jung Kim
,
Younheum Jung
,
Kyungwoo Lee
,
Gwangsun Byun
,
KyoungHwan
Hwang
,
Sunyoung Lee
,
Kyupil Lee
Published 2013-09-01
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