Development and implementation of narrowband-to-wideband expansion for telephony speech

by Mu-Chun Wang, 王慕羣
Published 2008

Nanomaterials and Nanodevices

by Xiao-Feng Zhao, Mu-Chun Wang, Jen-Ching Huang, You Qiang, In-Seok Yoon
Published 2015-01-01

High-Drain Field Impacting Channel-Length Modulation Effect for Nano-Node N-Channel FinFETs

by Mu-Chun Wang, Wen-Ching Hsieh, Chii-Ruey Lin, Wei-Lun Chu, Wen-Shiang Liao, Wen-How Lan
Published 2021-03-01

Hot Carrier Stress Sensing Bulk Current for 28 nm Stacked High-k nMOSFETs

by Chii-Wen Chen, Mu-Chun Wang, Cheng-Hsun-Tony Chang, Wei-Lun Chu, Shun-Ping Sung, Wen-How Lan
Published 2020-12-01

Q-Factor Performance of 28 nm-Node High-K Gate Dielectric under DPN Treatment at Different Annealing Temperatures

by Chii-Wen Chen, Shea-Jue Wang, Wen-Ching Hsieh, Jian-Ming Chen, Te Jong, Wen-How Lan, Mu-Chun Wang
Published 2020-12-01

On the Nitrogen Doping in Erbium and Nitrogen Codoped Magnesium Zinc Oxide Diode by Spray Pyrolysis

by Chun-An Chen, Yu-Ting Hsu, Wen-How Lan, Kai-Feng Huang, Kuo-Jen Chang, Mu-Chun Wang, Chien-Jung Huang
Published 2020-01-01

Electrical and Physical Characteristics of WO3/Ag/WO3 Sandwich Structure Fabricated with Magnetic-Control Sputtering Metrology †

by Shea-Jue Wang, Mu-Chun Wang, Shih-Fan Chen, Yu-Hsiang Li, Tien-Szu Shen, Hui-Yun Bor, Chao-Nan Wei
Published 2018-08-01

Thickness Study of Er-Doped Magnesium Zinc Oxide Diode by Spray Pyrolysis

by Yu-Ting Hsu, Che-Chi Lee, Wen-How Lan, Kai-Feng Huang, Kuo-Jen Chang, Jia-Ching Lin, Shao-Yi Lee, Wen-Jen Lin, Mu-Chun Wang, Chien-Jung Huang
Published 2018-12-01

Recovery Phenomenon of Nanoscale n-type FinFETs

by CHI,HAO-LO, 羅濟皓
Published 2019

Using Simulation to Investigate and Control RSCE Effects of 28 nm nMOSFETs with HK/MG stack.

by Jia-Siang Lan, 藍嘉祥

0.18 µm Comparator Design and Layout

by 黃俊穎
Published 2017

Degradation and Recovery of HfO2/ZrO2/HfO2 Dielectric Layer

by Shun-Ping Sung, 宋順平
Published 2017

Current Behaviors of 28nm-node nMOSFETs under Off-State and Negative Gate Bias

by Ko-Chin Hsu, 許克勤
Published 2017

Investigation of Temperature Dependence of Substrate Currents in NMOSFETs with 90nm Process

by Tung-Hsien Lee, 李東憲
Published 2007

A Metrology to Explore Collar TEOS Integrity of Deep-Submicron DT DRAM Capacitor with a Vertical Parasitic NMOSFET

by Ming-Hsien Weng, 翁銘賢
Published 2007

Shift of Maximum Substrate Current in 90nm NMOS Device

by Wu-Chieh Wen, 溫武傑
Published 2007

Degradation Mechanism for CLC Poly-Si n-TFTs under Low Vertical-Field HC Stress with Different Laser Annealing Powers

by Shih-Ying Chang, 張世穎
Published 2010

A Study of 45-nm-node Process n/p Strained Silicon Transistors with Silicon Capping Thicknesses

by Hsiu-Yen Yang, 楊修彥
Published 2010

單軸CESL應力下(110)面奈米等級MOSFET之通道電阻特性研究

by Yi-Jhen Li, 李懿真
Published 2011

Junction Efficiency for <110> Nano-regime CESL Strained MOS Devices with Different Si Capping Layers and Temperatures

by Ren-Hau Yang, 楊人澔
Published 2011