Random Strain Fluctuations as Dominant Disorder Source for High-Quality On-Substrate Graphene Devices

by Nuno J. G. Couto, Davide Costanzo, Stephan Engels, Dong-Keun Ki, Kenji Watanabe, Takashi Taniguchi, Christoph Stampfer, Francisco Guinea, Alberto F. Morpurgo
Published 2014-10-01