Effects of Annealing Atmosphere on Electrical Performance and Stability of High-Mobility Indium-Gallium-Tin Oxide Thin-Film Transistors

by Hwan-Seok Jeong, Hyun Seok Cha, Seong Hyun Hwang, Hyuck-In Kwon
Published 2020-11-01

Electrical Performance and Stability Improvements of High-Mobility Indium–Gallium–Tin Oxide Thin-Film Transistors using an Oxidized Aluminum Capping Layer of Optimal Thickness

by Hyun-Seok Cha, Hwan-Seok Jeong, Seong-Hyun Hwang, Dong-Ho Lee, Hyuck-In Kwon
Published 2020-12-01

Effects of Active Layer Thickness on the Electrical Characteristics and Stability of High-Mobility Amorphous Indium–Gallium–Tin Oxide Thin-Film Transistors

by Dae-Hwan Kim, Hyun-Seok Cha, Hwan-Seok Jeong, Seong-Hyun Hwang, Hyuck-In Kwon
Published 2021-05-01

Electrical Performance and Stability Improvement of p-Channel SnO Thin-Film Transistors Using Atomic-Layer-Deposited Al₂O₃ Capping Layer

by Kang-Hwan Bae, Min Gyu Shin, Seong-Hyun Hwang, Hwan-Seok Jeong, Dae-Hwan Kim, Hyuck-In Kwon
Published 2020-01-01

Effects of Oxygen Content on Operational Characteristics and Stability of High-Mobility IGTO Thin-Film Transistors during Channel Layer Deposition

by Hwan-Seok Jeong, Hyun-Seok Cha, Seong-Hyun Hwang, Dong-Ho Lee, Sang-Hun Song, Hyuck-In Kwon
Published 2021-06-01

Comparative Study on the Separate Extraction of Interface and Bulk Trap Densities in Indium Gallium Zinc Oxide Thin-Film Transistors Using Capacitance–Voltage and Current–Voltage C...

by Dong-Ho Lee, Dae-Hwan Kim, Hwan-Seok Jeong, Seong-Hyun Hwang, Sunhee Lee, Myeong-Ho Kim, Jun Hyung Lim, Hyuck-In Kwon
Published 2021-09-01