A Novel Prediction Method about Single Components of Analog Circuits Based on Complex Field Modeling

by Jingyu Zhou, Shulin Tian, Chenglin Yang
Published 2014-01-01

Fault Diagnosis for Analog Circuits by Using EEMD, Relative Entropy, and ELM

by Jian Xiong, Shulin Tian, Chenglin Yang
Published 2016-01-01

Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage

by Hongzhi Hu, Shulin Tian, Qing Guo
Published 2015-01-01

Parallel wideband digital up-conversion architecture with efficiency

by Tao Liu, Shulin Tian, Lianping Guo
Published 2019-10-01

Entropy Based Test Point Evaluation and Selection Method for Analog Circuit Fault Diagnosis

by Yuan Gao, Chenglin Yang, Shulin Tian, Fang Chen
Published 2014-01-01

Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine

by Jingyu Zhou, Shulin Tian, Chenglin Yang, Xuelong Ren
Published 2014-01-01

A Novel Method of Failure Sample Selection for Electrical Systems Using Ant Colony Optimization

by Jian Xiong, Shulin Tian, Chenglin Yang, Cheng Liu
Published 2016-01-01

Adaptive blind equalization of fast time‐varying channel with frequency estimation in impulsive noise environment

by Yijiao Zhang, Shulin Tian, Huiqing Pan, Yi Zhou
Published 2021-07-01

A Statistic-Based Calibration Method for TIADC System

by Kuojun Yang, Shulin Tian, Peng Ye, Peng Zhang, Yuanjin Zheng
Published 2015-01-01

Defect Automatic Identification of Eddy Current Pulsed Thermography

by Kai Chen, Libing Bai, Yifan Chen, Yuhua Cheng, Shulin Tian, Peipei Zhu
Published 2014-01-01

General Analysis of Resolution Enhancement on Time-Synchronized Sampling and its Multi-Resolution Solution in 20GSPS Acquisition System

by Wuhuang Huang, Jian Gao, Peng Ye, Kuojun Yang, Lianping Guo, Wentao Wei, Yu Zhao, Zhixiang Pan, Shulin Tian, Houjun Wang
Published 2019-01-01