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Thomas Prüfer
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Thomas Prüfer
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Site-controlled formation of single Si nanocrystals in a buried SiO2 matrix using ion beam mixing
by
Xiaomo Xu
,
Thomas
Prüfer
,
Daniel Wolf
,
Hans-Jürgen Engelmann
,
Lothar Bischoff
,
René Hübner
,
Karl-Heinz Heinig
,
Wolfhard Möller
,
Stefan Facsko
,
Johannes von Borany
,
Gregor Hlawacek
Published 2018-11-01
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