A Novel Built-In Self-Repair Scheme for 3D Memory

by Tianming Ni, Hao Chang, Yao Yao, Xueyun Li, Zhengfeng Huang
Published 2019-01-01

Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm

by Tai Song, Huaguo Liang, Tianming Ni, Zhengfeng Huang, Yingchun Lu, Jinlei Wan, Aibin Yan
Published 2020-01-01

Temperature-Aware Floorplanning for Fixed-Outline 3D ICs

by Tianming Ni, Hao Chang, Shidong Zhu, Lin Lu, Xueyun Li, Qi Xu, Huaguo Liang, Zhengfeng Huang
Published 2019-01-01