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Vita Pi-Ho Hu
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Vita Pi-Ho Hu
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Vita Pi-Ho Hu
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1
Reliability-Tolerant Design for Ultra-Thin-Body GeOI 6T SRAM Cell and Sense Amplifier
by
Vita
Pi
-
Ho
Hu
Published 2017-01-01
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Article
2
Impact of Work Function Variation, Line-Edge Roughness, and Ferroelectric Properties Variation on Negative Capacitance FETs
by
Vita
Pi
-
Ho
Hu
,
Pin-Chieh Chiu
,
Yi-Chun Lu
Published 2019-01-01
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Article
3
Investigation and Simulation of Work-Function Variation for III–V Broken-Gap Heterojunction Tunnel FET
by
Chih-Wei Hsu
,
Ming-Long Fan
,
Vita
Pi
-
Ho
Hu
,
Pin Su
Published 2015-01-01
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Article
4
Impacts of Work Function Variation and Line-Edge Roughness on TFET and FinFET Devices and 32-Bit CLA Circuits
by
Yin-Nien Chen
,
Chien-Ju Chen
,
Ming-Long Fan
,
Vita
Pi
-
Ho
Hu
,
Pin Su
,
Ching-Te Chuang
Published 2015-05-01
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Article
5
Analysis of Scalability and Variability for Negative Capacitance FETs
by
Pin-Chieh Chiu
,
邱品傑
Published 2018
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Ho
Hu
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6
Performance Enhancement of III-V Tunnel FETs considering Line Tunneling and Non-uniform Channel Thickness
by
Chiu-Ting Wang
,
王秋婷
Published 2018
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Pi
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Ho
Hu
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