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1Improving the precision of optical metrology by detecting fewer photons with biased weak measurementby Peng Yin, Wen-Hao Zhang, Liang Xu, Ze-Gang Liu, Wei-Feng Zhuang, Lei Chen, Ming Gong, Yu Ma, Xing-Xiang Peng, Gong-Chu Li, Jin-Shi Xu, Zong-Quan Zhou, Lijian Zhang, Geng Chen, Chuan-Feng Li, Guang-Can GuoGet full text
Published 2021-05-01
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