Degradation of GaN High Electron Mobility Transistors under high-power and high-temperature stress

by Wu, Yufei, Ph. D. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.
Published 2014

Reliability of W-Band InAIN/GaN High Electron Mobility Transistors

by Wu, Yufei, Ph. D. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Published 2017