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Zainudin, M.F
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Zainudin, M.F
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1
Aging analysis of high performance FinFET flip-flop under Dynamic NBTI simulation configuration
by
Halim, A.K
,
Hussin, H.
,
Karim, J.
,
Zainudin
,
M.F
Published 2018
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2
NBTI effects on circuit reliability performance of 4-bit Johnson counter based on different simulation configuration / M. F. Zainudin ...[et al.]
by
Zainudin
,
M
.
F
.
,
Hussin, H.
,
Karim, J.
,
Halim, A. K.
Published 2018
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Related Subjects
Circuit performance
Circuit reliability
Delay circuits
Electric apparatus and materials. Electric circuits. Electric networks
Electric network analysis
Electrical parameter
FinFET
Flip flop circuits
High-performance circuits
Integrated circuit manufacture
Negative bias temperature instability
Negative bias temperature instability (NBTI)
Negative stress
Simulation configuration
Stress condition
Thermodynamic stability
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