Characterization and modeling of nanotips fabricated in the field ion microscope
Nanotips are considered significant elements in some of nanotechnology instruments. They are used in scanning probe microscopes and electron microscopes to characterize materials at the nano and atomic scales. Therefore, the size and profile of the nanotip determines the performance of these microsc...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
De Gruyter
2016-06-01
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| Series: | Nanotechnology Reviews |
| Subjects: | |
| Online Access: | https://doi.org/10.1515/ntrev-2015-0037 |