A Competing Risk Model of Reliability Analysis for NAND-Based SSDs in Space Application
This paper develops a competing risk model to simultaneously analyze censored catastrophic failures and nonlinear degradation data of the NAND-based solid-state drives for space application. Two dominant failure modes are the hard failure of the controller due to single-event latch-up (SEL) and the...
Main Authors: | Peng Li, Wei Dang, Taichun Qin, Zeming Zhang, Congmin Lv |
---|---|
Format: | Article |
Language: | English |
Published: |
IEEE
2019-01-01
|
Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/8642871/ |
Similar Items
-
Effectiveness of models of degradation of functional parameters for predicting the parametric reliability of semiconductor devices
by: S. M. Borovikov, et al.
Published: (2019-06-01) -
WBG-Based PEBB Module for High Reliability Power Converters
by: Sebastian Baba, et al.
Published: (2021-01-01) -
Reliability of computer memories in radiation environment
by: Fetahović Irfan S., et al.
Published: (2016-01-01) -
Fabricacao e utilizacao de detetores semiconductores
by: LEMOS JUNIOR, ORLANDO F.
Published: (1969) -
Fabricacao e utilizacao de detetores semiconductores
by: LEMOS JUNIOR, ORLANDO F.
Published: (1969)