Windowing UWB microwave, mm-wave multi-port S-parameter measurements using open-ended excess electrical length
Multi-port measurements are a big challenge in circuits' verification, especially when the frequency increases. This study presents a new technique for measuring S-parameters of multi-port ultra-wideband (UWB) microwave and mm-wave circuits. The concepts are based on direct or indirect applying...
Main Authors: | , |
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Format: | Article |
Language: | English |
Published: |
Wiley
2017-05-01
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Series: | The Journal of Engineering |
Subjects: | |
Online Access: | http://digital-library.theiet.org/content/journals/10.1049/joe.2017.0163 |