APA (7th ed.) Citation

Zhao, M., Gao, B., Xi, Y., Xu, F., Wu, H., & Qian, H. (2019). Endurance and Retention Degradation of Intermediate Levels in Filamentary Analog RRAM. IEEE.

Chicago Style (17th ed.) Citation

Zhao, Meiran, Bin Gao, Yue Xi, Feng Xu, Huaqiang Wu, and He Qian. Endurance and Retention Degradation of Intermediate Levels in Filamentary Analog RRAM. IEEE, 2019.

MLA (8th ed.) Citation

Zhao, Meiran, et al. Endurance and Retention Degradation of Intermediate Levels in Filamentary Analog RRAM. IEEE, 2019.