Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials

Many functional materials are difficult to analyse by scanning transmission electron microscopy (STEM) on account of their beam sensitivity and low contrast between different phases. The problem becomes even more severe when thick specimens need to be investigated, a situation that is common for mat...

Full description

Bibliographic Details
Main Authors: Karthikeyan Gnanasekaran, Gijsbertus de With, Heiner Friedrich
Format: Article
Language:English
Published: The Royal Society 2018-01-01
Series:Royal Society Open Science
Subjects:
Online Access:https://royalsocietypublishing.org/doi/pdf/10.1098/rsos.171838