Multifrequency Excitation Method for Rapid and Accurate Dynamic Test of Micromachined Gyroscope Chips
A novel multifrequency excitation (MFE) method is proposed to realize rapid and accurate dynamic testing of micromachined gyroscope chips. Compared with the traditional sweep-frequency excitation (SFE) method, the computational time for testing one chip under four modes at a 1-Hz frequency resolutio...
Main Authors: | , , , |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2014-10-01
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Series: | Sensors |
Subjects: | |
Online Access: | http://www.mdpi.com/1424-8220/14/10/19507 |