Semantic Feature Learning via Dual Sequences for Defect Prediction

Semantic Feature Learning via Dual Sequences for Defect Prediction

Software defect prediction (SDP) can help developers reasonably allocate limited resources for locating bugs and prioritizing their testing efforts. Existing methods often serialize an Abstract Syntax Tree (AST) obtained from the program source code into a token sequence, which is then inputted into...

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Bibliographic Details
Main Authors: Junhao Lin, Lu Lu
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
Software defect prediction
abstract syntax tree
deep learning
bi-directional long short-term memory network
Online Access:https://ieeexplore.ieee.org/document/9326378/

Internet

https://ieeexplore.ieee.org/document/9326378/

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