Tuning the Electrical Properties of NiO Thin Films by Stoichiometry and Microstructure
Here, the electrical properties of NiO thin films grown on glass and Al<sub>2</sub>O<sub>3</sub> (0001) substrates have been investigated. It was found that the resistivity of NiO thin films strongly depends on oxygen stoichiometry. Nearly perfect stoichiometry yields extreme...
Main Authors: | Yu-He Liu, Xiao-Yan Liu, Hui Sun, Bo Dai, Peng Zhang, Yong Wang |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2021-06-01
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Series: | Coatings |
Subjects: | |
Online Access: | https://www.mdpi.com/2079-6412/11/6/697 |
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