High-quality single crystalline NiO with twin phases grown on sapphire substrate by metalorganic vapor phase epitaxy

High-quality single crystalline twin phase NiO grown on sapphire substrates by metalorganic vapor phase epitaxy is reported. X-ray rocking curve analysis of NiO films grown at different temperatures indicates a minimum full width at half maximum of the cubic (111) diffraction peak of 0.107° for NiO...

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Bibliographic Details
Main Authors: Kazuo Uchida, Ken-ichi Yoshida, Dongyuan Zhang, Atsushi Koizumi, Shinji Nozaki
Format: Article
Language:English
Published: AIP Publishing LLC 2012-12-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4769082