An Improved Test Selection Optimization Model Based on Fault Ambiguity Group Isolation and Chaotic Discrete PSO

Sensor data-based test selection optimization is the basis for designing a test work, which ensures that the system is tested under the constraint of the conventional indexes such as fault detection rate (FDR) and fault isolation rate (FIR). From the perspective of equipment maintenance support, the...

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Bibliographic Details
Main Authors: Xiaofeng Lv, Deyun Zhou, Yongchuan Tang, Ling Ma
Format: Article
Language:English
Published: Hindawi-Wiley 2018-01-01
Series:Complexity
Online Access:http://dx.doi.org/10.1155/2018/3942723