Broadband Measurement of Substrate Complex Permittivity Using Optimized ABCD Matrix
In this paper, a novel two-transmission-line method based on optimized ABCD matrix for broadband and continuous substrate dielectric characterization is presented. The original single-line algorithm is firstly discussed and simulated, while the measurement shows that the extracted parameters are far...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
IEEE
2020-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/9293275/ |