Broadband Measurement of Substrate Complex Permittivity Using Optimized ABCD Matrix

In this paper, a novel two-transmission-line method based on optimized ABCD matrix for broadband and continuous substrate dielectric characterization is presented. The original single-line algorithm is firstly discussed and simulated, while the measurement shows that the extracted parameters are far...

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Bibliographic Details
Main Authors: Longzhu Cai, Zhi Hao Jiang, Wei Hong
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9293275/