Classification of methods for measuring current-voltage characteristics of semiconductor devices
It is shown that computer systems for measuring current-voltage characteristics are very important for semiconductor devices production. The main criteria of efficiency of such systems are defined. It is shown that efficiency of such systems significantly depends on the methods for measuring current...
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| Format: | Article |
| Language: | English |
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Politehperiodika
2014-06-01
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| Series: | Tekhnologiya i Konstruirovanie v Elektronnoi Apparature |
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| Online Access: | http://www.tkea.com.ua/tkea/2014/2-3_2014/pdf/01.pdf |