COMPARATIVE ESTIMATION OF SEMICONDUCTOR DICE MOUNTING ALTERNATE NONDESTRUCTIVE EVALUATION METHODS
Conventional method of nondestructive control - laser microinterferometry, which possibilities have been earlier expanded concerning to study “semiconductor chip - substrate” assemblies peculiarity, has given the chance to evaluate these assemblies stability to mechanical, electric and thermal loadi...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | Russian |
| Published: |
Educational institution «Belarusian State University of Informatics and Radioelectronics»
2019-06-01
|
| Series: | Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki |
| Subjects: | |
| Online Access: | https://doklady.bsuir.by/jour/article/view/629 |