Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films

Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films

Spatial variability of conductivity in ceria is explored using scanning probe microscopy with galvanostatic control. Ionically blocking electrodes are used to probe the conductivity under opposite polarities to reveal possible differences in the defect structure across a thin film of Ce...

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Bibliographic Details
Main Authors: Tim Farrow, Nan Yang, Sandra Doria, Alex Belianinov, Stephen Jesse, Thomas M. Arruda, Giuseppe Balestrino, Sergei V. Kalinin, Amit Kumar
Format: Article
Language:English
Published: AIP Publishing LLC 2015-03-01
Series:APL Materials
Online Access:http://dx.doi.org/10.1063/1.4914943

Internet

http://dx.doi.org/10.1063/1.4914943

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