Local Stress States and Microstructural Damage Response Associated with Deformation Twins in Hexagonal Close Packed Metals

The current work implements a correlative microscopy method utilizing electron back scatter diffraction, focused ion beam and digital image correlation to accurately determine spatially resolved stress profiles in the vicinity of grain/twin boundaries and tensile deformation twin tips in commerciall...

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Bibliographic Details
Main Authors: Indranil Basu, Herman Fidder, Václav Ocelík, Jeff Th.M de Hosson
Format: Article
Language:English
Published: MDPI AG 2017-12-01
Series:Crystals
Subjects:
Online Access:https://www.mdpi.com/2073-4352/8/1/1