Controlling Electrical Conduction through Noble Metal Thin Films by Surface Plasmon Resonance
We have conducted in situ measurements of the surface plasmons and electrical resistivity of noble metal thin films. We present results for the electrical resistivity of these materials as functions of the angle of incidence for <i>p</i>-polarized light of wavelength λ = 632 nm in the Kr...
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-08-01
|
| Series: | Condensed Matter |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2410-3896/5/3/52 |