A Simulation Study of a Gate-All-Around Nanowire Transistor with a Core–Insulator

Ultra-low power and high-performance logical devices have been the driving force for the continued scaling of complementary metal oxide semiconductor field effect transistors which greatly enable electronic devices such as smart phones to be energy-efficient and portable. In the pursuit of smaller a...

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Bibliographic Details
Main Authors: Yannan Zhang, Ke Han, and Jiawei Li
Format: Article
Language:English
Published: MDPI AG 2020-02-01
Series:Micromachines
Subjects:
gaa
Online Access:https://www.mdpi.com/2072-666X/11/2/223