Statistical Strategies to Capture Correlation Between Overshooting Effect and Propagation Delay Time in Nano-CMOS Inverters

Statistical Strategies to Capture Correlation Between Overshooting Effect and Propagation Delay Time in Nano-CMOS Inverters

In this paper, we model statistical correlation between overshooting effect and propagation delay time in nano-CMOS technology considering the influence of intrinsic parameter fluctuations caused by discreteness of charge and granularity of matter. The impact of input slew rate, output capacitive lo...

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Bibliographic Details
Main Authors: Hamed Jooypa, Daryoosh Dideban, Hadi Heidari
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
Propagation delay time
statistical variability
nano-CMOS
overshoot voltage
statistical modelling
Online Access:https://ieeexplore.ieee.org/document/9417181/

Internet

https://ieeexplore.ieee.org/document/9417181/

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