Pattern recognition applying LDA and LR to optoelectronic signals of optical scanning systems

Pattern recognition applying LDA and LR to optoelectronic signals of optical scanning systems

This paper is a follow-up to previous researches already published regarding the minimization of optical-electrical noise in optical scanning systems OSS, by the implementation of computational techniques for pattern recognition generated by each reference source used to indicate a coordinate that t...

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Bibliographic Details
Main Authors: J. E. Miranda-Vega, M. Rivas-López, W. Flores-Fuentes, O. Sergiyenko, L. Lindner, J. C. Rodríguez-Quiñonez
Format: Article
Language:Spanish
Published: Universitat Politecnica de Valencia 2020-09-01
Series:Revista Iberoamericana de Automática e Informática Industrial RIAI
Subjects:
análisis y tratamiento de señales
sensores e instrumentos virtuales
ruido
modulación
visión 3d y estéreo
Online Access:https://polipapers.upv.es/index.php/RIAI/article/view/12385

Internet

https://polipapers.upv.es/index.php/RIAI/article/view/12385

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