A stress test on 235U(n, f) in adjustment with HCI and HMI benchmarks
To understand how compensation errors occur in a nuclear data adjustment mostly devoted to U-Pu fuelled fast critical experiments and with only limited information on U-235 data, a stress test on 235U(n,f) was suggested, using critical benchmarks sensitive to 235U(n,f) in 1∼ 10 keV region. The adjus...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2017-01-01
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| Series: | EPJ Web of Conferences |
| Online Access: | https://doi.org/10.1051/epjconf/201714606027 |