Analysis of Anti-JFET for 600V VDMOS and HCI Reliability

In VDMOS device the anti-JFET concentration has important role for determining the breakdown voltage and on-resistance of the device. Because higher N-drift doping concentration can provide the very best on-resistance of the device but also decrease breakdown voltage. It also has a proportional rela...

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Bibliographic Details
Main Authors: Yang Shao-Ming, Sheu Gene, Lai Chiu-Chung, Deivasigamani Ravi
Format: Article
Language:English
Published: EDP Sciences 2018-01-01
Series:MATEC Web of Conferences
Online Access:https://doi.org/10.1051/matecconf/201820105001