Whole-pattern fitting technique in serial femtosecond nanocrystallography

Whole-pattern fitting technique in serial femtosecond nanocrystallography

Serial femtosecond X-ray crystallography (SFX) has created new opportunities in the field of structural analysis of protein nanocrystals. The intensity and timescale characteristics of the X-ray free-electron laser sources used in SFX experiments necessitate the analysis of a large collection of ind...

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Bibliographic Details
Main Authors: Ruben A. Dilanian, Sophie R. Williams, Andrew V. Martin, Victor A. Streltsov, Harry M. Quiney
Format: Article
Language:English
Published: International Union of Crystallography 2016-03-01
Series:IUCrJ
Subjects:
protein nanocrystallography
peak-shape analysis
whole-pattern fitting
X-ray free-electron lasers
nanocrystals
SFX
protein structure
XFEL
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252516001238

Internet

http://scripts.iucr.org/cgi-bin/paper?S2052252516001238

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