Non-destructive Inspection of Voids on Power MOSFET’s
Voids can affect the normal function on Power Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFET’s) if they are over 25% of the total area, this being animportant feature in the quality control of voids on the manufacturing process. The ex-perimental method was employed using the S...
| Main Authors: | , , |
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| Format: | Article |
| Language: | Spanish |
| Published: |
Universidad Nacional de Chimborazo
2019-06-01
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| Series: | NOVASINERGIA |
| Subjects: | |
| Online Access: | http://novasinergia.unach.edu.ec/index.php/novasinergia/article/view/85/65 |