A Data-Driven Approach for Identifying Possible Manufacturing Processes and Production Parameters That Cause Product Defects: A Thin-Film Filter Company Case Study

A Data-Driven Approach for Identifying Possible Manufacturing Processes and Production Parameters That Cause Product Defects: A Thin-Film Filter Company Case Study

A semiconductor or photoelectric manufacturer faces a more competitive market with small quantities of many products. These products require hundreds of processes for production, thereby generating huge manufacturing data. With the help of the Internet of Things (IoT) technology, the manufacturer ca...

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Bibliographic Details
Main Authors: Jrjung Lyu, Chia Wen Liang, Ping-Shun Chen
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Data-driven
data mining
process improvement
association rule mining
decision tree
thin-film filter (TFF)
Online Access:https://ieeexplore.ieee.org/document/9000922/

Internet

https://ieeexplore.ieee.org/document/9000922/

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