Ti-catalyzed HfSiO4 formation in HfTiO4 films on SiO2 studied by Z-contrast scanning electron microscopy

Ti-catalyzed HfSiO4 formation in HfTiO4 films on SiO2 studied by Z-contrast scanning electron microscopy

Hafnon (HfSiO4) as it is initially formed in a partially demixed film of hafnium titanate (HfTiO4) on fused SiO2 is studied by atomic number (Z) contrast high resolution scanning electron microscopy, x-ray diffraction, and Raman spectroscopy and microscopy. The results show exsoluted Ti is the catal...

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Bibliographic Details
Main Authors: Elizabeth Ellen Hoppe, Massiel Cristina Cisneros-Morales, Carolyn Rubin Aita
Format: Article
Language:English
Published: AIP Publishing LLC 2013-08-01
Series:APL Materials
Online Access:http://link.aip.org/link/doi/10.1063/1.4818171

Internet

http://link.aip.org/link/doi/10.1063/1.4818171

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