Multiple Controlled Antirandom Testing (MCAT) for High Fault Coverage in a Black Box Environment

Multiple Controlled Antirandom Testing (MCAT) for High Fault Coverage in a Black Box Environment

Among the black-box approaches to digital circuit testing, Random testing is popular due to its simplicity and cost effectiveness. Unfortunately, available evidences suggest that Random testing is equipped with a number of redundant patterns that increase test length without significantly raising th...

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Bibliographic Details
Main Authors: Arbab Alamgir, Abu Khari Bin A'Ain, Usman Ullah Sheikh, Norlina Paraman, Musa Mohd Mokji, Ian Grout
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Antirandom
test pattern generation
computation reduction
multiple controlled antirandom tests
Online Access:https://ieeexplore.ieee.org/document/8811467/

Internet

https://ieeexplore.ieee.org/document/8811467/

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