Multiple Controlled Antirandom Testing (MCAT) for High Fault Coverage in a Black Box Environment
Among the black-box approaches to digital circuit testing, Random testing is popular due to its simplicity and cost effectiveness. Unfortunately, available evidences suggest that Random testing is equipped with a number of redundant patterns that increase test length without significantly raising th...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2019-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8811467/ |