Four-Fold Multi-Modal X-ray Microscopy Measurements of a Cu(In,Ga)Se<sub>2</sub> Solar Cell

Four-Fold Multi-Modal X-ray Microscopy Measurements of a Cu(In,Ga)Se<sub>2</sub> Solar Cell

Inhomogeneities and defects often limit the overall performance of thin-film solar cells. Therefore, sophisticated microscopy approaches are sought to characterize performance and defects at the nanoscale. Here, we demonstrate, for the first time, the simultaneous assessment of composition, structur...

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Bibliographic Details
Main Authors: Christina Ossig, Christian Strelow, Jan Flügge, Andreas Kolditz, Jan Siebels, Jan Garrevoet, Kathryn Spiers, Martin Seyrich, Dennis Brückner, Niklas Pyrlik, Johannes Hagemann, Andreas Schropp, Romain Carron, Gerald Falkenberg, Alf Mews, Christian G. Schroer, Tobias Kipp, Michael E. Stuckelberger
Format: Article
Language:English
Published: MDPI AG 2021-01-01
Series:Materials
Subjects:
CIGS
X-ray imaging
XBIC
XEOL
XRF
ptychography
Online Access:https://www.mdpi.com/1996-1944/14/1/228

Internet

https://www.mdpi.com/1996-1944/14/1/228

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