Microscopic study of electrical properties of CrSi<sub>2 </sub>nanocrystals in silicon
<p>Abstract</p> <p>Semiconducting CrSi<sub>2 </sub>nanocrystallites (NCs) were grown by reactive deposition epitaxy of Cr onto <it>n</it>-type silicon and covered with a 50-nm epitaxial silicon cap. Two types of samples were investigated: in one of them, the...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
SpringerOpen
2011-01-01
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| Series: | Nanoscale Research Letters |
| Online Access: | http://www.nanoscalereslett.com/content/6/1/209 |