GaN and InGaN nanowires prepared by metal-assisted electroless etching: Experimental and theoretical studies
We investigate the optical and structural properties of GaN and InGaN nanowires (NWs) fabricated by metal-assisted electroless etching in a hydrofluoric acid (HF) solution. The emission spectra of GaN and InGaN NWs exhibit a red shift compared to the as-grown samples resulting from an increase in th...
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doaj-0caef1545f974207aae2972767cd0bd02020-12-25T05:08:32ZengElsevierResults in Physics2211-37972020-12-0119103428GaN and InGaN nanowires prepared by metal-assisted electroless etching: Experimental and theoretical studiesS. Assa Aravindh0Bin Xin1Somak Mitra2Iman S. Roqan3Adel Najar4King Abdullah University of Science and Technology, Physical Science and Engineering (PSE) Division, Thuwal 23955-6900, Saudi Arabia; Nano and Molecular Systems Research Unit, University of Oulu, P.O. Box 8000, FI-90014 Oulu, FinlandKing Abdullah University of Science and Technology, Physical Science and Engineering (PSE) Division, Thuwal 23955-6900, Saudi ArabiaKing Abdullah University of Science and Technology, Physical Science and Engineering (PSE) Division, Thuwal 23955-6900, Saudi ArabiaKing Abdullah University of Science and Technology, Physical Science and Engineering (PSE) Division, Thuwal 23955-6900, Saudi Arabia; Corresponding authors.Department of Physics, College of Science, United Arab Emirates University, Al Ain 15551, United Arab Emirates; Corresponding authors.We investigate the optical and structural properties of GaN and InGaN nanowires (NWs) fabricated by metal-assisted electroless etching in a hydrofluoric acid (HF) solution. The emission spectra of GaN and InGaN NWs exhibit a red shift compared to the as-grown samples resulting from an increase in the surface-to-volume ratio and stress relaxation in these nanostructures. The carrier lifetimes of GaN and InGaN NWs were measured. In addition, density functional theory (DFT) investigations were carried out on GaN and InGaN NWs using the generalized gradient approximation (GGA), including the Hubbard U parameter. The presence of compressive stress in the NWs was confirmed by the DFT calculations, which indicated that it induces a change in the lattice parameter along the c-direction. Formation energy calculations showed that In is a much more stable dopant in the GaN NWs compared to the native point defects, such as Ga and N vacancies. Moreover, electronic structure analysis revealed that the complex defects formed by the presence of In along with vacancy defects shifts the valence band maximum, thus changing the conducting properties of the NWs.http://www.sciencedirect.com/science/article/pii/S2211379720318945GaNInGaNNanowiresDFTElectronic structure |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
S. Assa Aravindh Bin Xin Somak Mitra Iman S. Roqan Adel Najar |
spellingShingle |
S. Assa Aravindh Bin Xin Somak Mitra Iman S. Roqan Adel Najar GaN and InGaN nanowires prepared by metal-assisted electroless etching: Experimental and theoretical studies Results in Physics GaN InGaN Nanowires DFT Electronic structure |
author_facet |
S. Assa Aravindh Bin Xin Somak Mitra Iman S. Roqan Adel Najar |
author_sort |
S. Assa Aravindh |
title |
GaN and InGaN nanowires prepared by metal-assisted electroless etching: Experimental and theoretical studies |
title_short |
GaN and InGaN nanowires prepared by metal-assisted electroless etching: Experimental and theoretical studies |
title_full |
GaN and InGaN nanowires prepared by metal-assisted electroless etching: Experimental and theoretical studies |
title_fullStr |
GaN and InGaN nanowires prepared by metal-assisted electroless etching: Experimental and theoretical studies |
title_full_unstemmed |
GaN and InGaN nanowires prepared by metal-assisted electroless etching: Experimental and theoretical studies |
title_sort |
gan and ingan nanowires prepared by metal-assisted electroless etching: experimental and theoretical studies |
publisher |
Elsevier |
series |
Results in Physics |
issn |
2211-3797 |
publishDate |
2020-12-01 |
description |
We investigate the optical and structural properties of GaN and InGaN nanowires (NWs) fabricated by metal-assisted electroless etching in a hydrofluoric acid (HF) solution. The emission spectra of GaN and InGaN NWs exhibit a red shift compared to the as-grown samples resulting from an increase in the surface-to-volume ratio and stress relaxation in these nanostructures. The carrier lifetimes of GaN and InGaN NWs were measured. In addition, density functional theory (DFT) investigations were carried out on GaN and InGaN NWs using the generalized gradient approximation (GGA), including the Hubbard U parameter. The presence of compressive stress in the NWs was confirmed by the DFT calculations, which indicated that it induces a change in the lattice parameter along the c-direction. Formation energy calculations showed that In is a much more stable dopant in the GaN NWs compared to the native point defects, such as Ga and N vacancies. Moreover, electronic structure analysis revealed that the complex defects formed by the presence of In along with vacancy defects shifts the valence band maximum, thus changing the conducting properties of the NWs. |
topic |
GaN InGaN Nanowires DFT Electronic structure |
url |
http://www.sciencedirect.com/science/article/pii/S2211379720318945 |
work_keys_str_mv |
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