Photoelastic and finite element stress analysis reliability for implant-supported system stress investigation

Aim: To compare the reliability between photoelastic and finite element (FE) analyses by evaluating the effect of different marginal misfit levels on the stresses generated on two different implant-supported systems using conventional and short implants. Methods: Two photoelastic models were obtaine...

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Bibliographic Details
Main Authors: Anna Gabriella Camacho Presotto, Cláudia Lopes Brilhante Bhering, Ricardo Armini Caldas, Rafael Leonardo Xediek Consani, Valentim Adelino Ricardo Barão, Marcelo Ferraz Mesquita
Format: Article
Language:English
Published: Universidade Estadual de Campinas 2018-07-01
Series:Brazilian Journal of Oral Sciences
Subjects:
Online Access:https://periodicos.sbu.unicamp.br/ojs/index.php/bjos/article/view/8652941